Interdisciplinary Resource Center for Nanotechnology

...going for nano

Books: Scanning Electron Microscopy and X-ray Microanalysis
Title:      Scanning Electron Microscopy and X-ray Microanalysis
Authors:      Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, L.C. Sawyer, J.R. Michael
ISBN-10(13):      0306472929
Publisher:      Springer
Publication date:      2003-02
Edition:      3rd
Language:      English
Picture:      cover
     
   

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